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Nuclear Event Detector
VB
8 9
HSN-3000
VL
1
Threshold Adjust
VH
14
10 k
Detector (Pin Diode)
2
NED
Amplifier
Pulse Timer
10 k
Logic Latch BIT 6 LED
13
NEF
11
Flag Reset
7
5
4
12
GND
C
RC
Flag Reset
Logic Diagram
FEATURES:
* * * * * * * * * * Detects ionizing radiation pulses 100% tested/certified detection threshold level Adjustable circumvention period Flag remembers event occurred 100% testable with built-in test Detection threshold adjustability Single +5V operation Radiation hardness guaranteed Compliant to MIL-PRF-38534 Class H1 Flat pack (F) or DIP (L) packages
DESCRIPTION:
Maxwell Technologies' HSN-3000 radiation-hardened Hybrid Nuclear Event Detector (NED) senses ionizing radiation pulses generated by a nuclear event, such as the detonation of a nuclear weapon, and rapidly switches its outputs from the normal high state to a low state with a propagation delay time of less than 20ns. The active low Nuclear Event Detection signal (NED) is used to initiate a wide variety of circumvention functions, thus preventing upset and burnout of electronic components. The NED output is also used to initiate both hardware and software recovery. The Nuclear Evet Flag signal (NEF) remembers the event occurred and is used to distinguish between an actual event and power up. The signal input of either Flag Reset or Flag Reset can be used to reset the NEF output. This high-speed, 14-pin hybrid detector is used in electronic systems as a general-purpose circumvention device to protect memory, stop data processing, and drive power supply switches as well as signal clamps. The HSN-3000 is guaranteed to operate through three critical environments: ionizing dose rate [1012 rad(Si)/s], gamma total dose [106 rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addition, the device is designed to function throughout the transient neutron pulse. The hybrid's discrete design ensures a controlled response in these radiation environments as well as immunity to latchup. Each HSN-3000's detection level and functionality are tested in an ionizing dose rate environment. A certificate is provided with each serialized hybrid, reporting the radiation test results and guaranteeing its performance. The device is also lot qualified in the total dose and neutron environments to ensure performance. The detection threshold of the HSN-3000 is adjustable within the range of 2 x 105 rad(Si)/s to 2 x 107 rad(Si)/s. This detection level can be preset by Maxwell or adjusted by the user. Less than a 30% variation in detection threshold can be expected over the entire operating temperature range.
Memory
RADIATION HARDNESS CHARACTERISTICS:
* * * * * Dose Rate (operate-through): 1 x 1012 rad(Si)/sec Total Dose: 1 x 106 rad(Si) Neutron Fluence: 5 x 1013 n/cm2 Approximate Detection Range: 2 x 105 - 2 x 107 rad(Si)/sec Maxwell Technologies Specified, Controlled, Tested and Guaranteed
1.
Manufactured for Maxwell Technologies by Teledyne Microelectronic Technologies to MIL-PRF-38534, Class H, No RHA
01.07.05 Rev 3
All data sheets are subject to change without notice
1
(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com
(c)2005 Maxwell Technologies All rights reserved.
Nuclear Event Detector
TABLE 1. PIN DESCRIPTION
PIN NUMBER PIN FUNCTION 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Load Voltage, VL Nuclear Event Detector, NED No Connection External Capacitor External Capacitor Built In Test, BIT Package Ground and Case PIN Diode Bias, VB Threshold Adjust No Connection Flag Reset
HSN-3000
Memory
Flag Reset Nuclear Event Flag, NEF Hardened Supply Voltage, VH
TABLE 2. ELECTRICAL CHARACTERISTICS
PARAMETER Hardened Supply Voltage Hardened Supply Current - Standby 1 - Flag Set 2 - Operational 3 Load Voltage Load Current - Standby 1 - Operational 3 PIN Diode Bias Voltage - Standby 1 PIN Diode Bias Current - Standby 1 FLAG RESET (Pin 12) SYMBOL VH IH VH = 5.5V ---VL IL VL = 20V --VB IB VIH IIH VIL IIL tPW VIH = 4.0V VIL = 0.5V VIH = 4.0V 4.5 -4.0 ---250 100 4.5 20 100 -4.0 0.5 100 -A mA V A V mA V A ns 1,2,3 1,2,3 7,8 1,2,3 7,8 1,2,3 9,10,11 -CONDITIONS -55 C < TA < 125 C MIN 4.5 MAX 5.5 -30 60 150 20 UNIT V mA GROUP A SUBGROUP 1,2,3 1,2,3
V
1,2,3 1,2,3
01.07.05 Rev 3
All data sheets are subject to change without notice
2
(c)2005 Maxwell Technologies All rights reserved.
Nuclear Event Detector
TABLE 2. ELECTRICAL CHARACTERISTICS
PARAMETER FLAG RESET (Pin 11) SYMBOL VIL IIL tPW VIH IIH VIL IIL tPW VOH VOL tD VOH VOL VL = 20V, IOH = -100 A IOL = 10 mA CONDITIONS -55 C < TA < 125 C VIL = 0.5V, VH = 5.5V VIL = 0.5V VIH = 4.0V VIL = 0.5V Pin 9 Open, VIH = 4.0V VL = 20V, IOH = -100 A IOL = 10 mA IOL = 100 mA MIN --250 4.0 ---10 18.5 ---18.5 -MAX 0.5 -30 -5.5 25 0.5 10 --0.6 1.0 20 -0.6
HSN-3000
UNIT V mA ns V mA V A s V GROUP A SUBGROUP 7,8 1,2,3 9,10,11 7,8 1,2,3 7,8 1,2,3 9,10,11 1,2,3 1,2,3
Built-In-Test (BIT) 4,5
NED
Radiation Propagation Delay Time 6 NEF
ns V 1,2,3 1,2,3
Memory
1. Standby mode is the normal state of the device, defined as having both the NED and NEF outputs (pins 2 and 13) in the "high" state. 2. Flag Set mode occurs after an event has been detected or BIT has been initiated and the NED output has timed out (i.e., has transitioned to the "high" state), leaving the NEF output as the only remaining output in the low state. 3. Operational mode is in effect during the timeout period of the NED signal, characterized by having both the NED and NEF outputs in the "low" state, causing the greatest current draw of the device. 4. BIT electrical characteristics are not guaranteed over the radiation range. 5. BIT may not meet specification when only a resistor is used to adjust the detection level. To use BIT in this situation, it is advised that a series resistor/capacitor combination is used. 6. Guaranteed but not tested over temperature. Time delay, tD, is measured at 50% points from the rising edge of the radiation pulse to the falling edge of the NED output at approximately 10 times the detection level.
01.07.05 Rev 3
All data sheets are subject to change without notice
3
(c)2005 Maxwell Technologies All rights reserved.
Nuclear Event Detector
0.600 0.015 0.003 0.145 MAX
HSN-3000
TOP VIEW
0.070 0.002 0.795 0.600 0.100 TYP
0.100 TYP
0.500 MIN
14 13 12 11 10 9 8
0.495
1 2 3 4 5 6 7
14 13 12 11 10 1 2 3 4 5
9 6
8 7
0.300
0.495
0.145 MAX
0.795 0.010 0.002
0.200
Memory
Flatpack Hybrid Package HSN-3000F
All tolerances are 0.005 unless specified
0.016 DIA 0.020
DIP Hybrid Package HSN-3000L
MECHANICAL DIMENSIONS
Note: All dimensions in inches.
Important Notice: The specifications presented within these data sheets represent the latest and most accurate information available to date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no responsibility for the use of this information. Maxwell Technologies' products are not authorized for use as critical components in life support devices or systems without express written approval from Maxwell Technologies. Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Technologies. Maxwell Technologies' liability shall be limited to replacement of defective parts.
01.07.05 Rev 3
All data sheets are subject to change without notice
4
(c)2005 Maxwell Technologies All rights reserved.
Nuclear Event Detector
Product Ordering Options
HSN-3000
Model Number HSN-3000 X Feature Option Details
Package
L = Dual In-line Package (DIP) F = Flat Pack
Base Product Nomenclature
Nuclear Event Detector
Memory
01.07.05 Rev 3
All data sheets are subject to change without notice
5
(c)2005 Maxwell Technologies All rights reserved.

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